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DFG-Project – Test and Reliability of Nano-Electronic Systems
The increasing number of fabrication defects, spatial and temporal variability of parameters, as well as the growing impact of soft errors in nanoelectronic systems require a paradigm shift in design, verification and test...
Keywords: Nanoelektronik, Entwurf, Test, Zuverlässigkeit, Fehlertoleranz/Nano-electronics
05/2006 | it – Information Technology (vormals it+ti), Oldenbourg Wissenschaftsverlag