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Nanocrystalline materials studied by powder diffraction line profile analysis
X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain...
Keywords: X-ray powder diffraction, Line profile analysis, Nanocrystals, Crystallite size, Subgrains
03/2007 | Zeitschrift für Kristallographie, Oldenbourg Wissenschaftsverlag