This article presents a non-destructive test procedure for bond strength characterization. The approach is based on a modified blister test where the length of an artificially generated crack in combination with the applied pressure indicates the bond strength of the composite...
Keywords: MEMS, full-wafer-bonding, strength characterization, non-destructive test procedures
01/2006 | tm Technisches Messen, Oldenbourg Wissenschaftsverlag