Items for "Nanomaterials"

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults...

Keywords: X-ray line profile analysis, Nanomaterials, Crystallite size, Dislocations, Planar defects