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Items for "micro probes"

Linking up Various Detection Systems for Dimensional Measurements in the Micro- and Nanorange with the Nanomeasuring Machine

The proceeding miniaturization of components in the semiconductor and MEMS industries raises the demands on the accuracy of the measuring instruments applied in quality assurance systems...

Keywords: nanometrology, scanning probe microscopy, profilometer, focus sensor, micro probes

09/2006 | tm – Technisches Messen, Oldenbourg Wissenschaftsverlag