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Items for "metrology"
Nano-roughness Assessment by Light Scattering Measurement
The tremendous development in the field of nanotechnologies results in novel challenges for industry-tailored measurement techniques...
Keywords: nanostructure, metrology, light scattering, roughness, functional surfaces
01/2006 | tm – Technisches Messen, Oldenbourg WissenschaftsverlagAutomatic Segmentation of Measurement Point Clouds to Geometric Primitives
Due to the availability of modern sensors like micro computer tomographs the point clouds that have to be processed in microsystem technology get increasingly larger...
Keywords: metrology, point cloud, automatic segmentation, geometric primitives
01/2006 | tm – Technisches Messen, Oldenbourg WissenschaftsverlagDigital Holographic Microscopy for Comparative Metrology in Micro-Optics and MOEMs
Digital holographic microscopy (DHM) is an imaging technique, which can be applied to the visualisation and metrology of microscopic objects...
Keywords: digital holography, metrology, micro-optics
03/2006 | tm – Technisches Messen, Oldenbourg Wissenschaftsverlag