Atomic force acoustic microscopy (AFAM) is a near-field technique, where the vibration behavior of a micro-fabricated elastic cantilever beam in contact with a sample surface is sensitive to its local elastic properties...
Keywords: Nanocrystalline Nickel, Atomic Force Acoustic Microscopy, contact mechanics, Indentation Modulus, nanoindentation
02/2008 | Zeitschrift für Physikalische Chemie, Oldenbourg Wissenschaftsverlag