We recently proposed a new grazing exit geometry for measuring the small-angle scattering from thin film materials, which we call GESAXS, to contrast with the successful grazing incidence version, GISAXS...
Keywords: Grain size distribution, Metal thin films, X-ray diffraction, GESAXS, Nanostructures
11/2007 | Zeitschrift für Kristallographie, Oldenbourg Wissenschaftsverlag