Items for "Fehlertoleranz/Nano-electronics"

DFG-Project – Test and Reliability of Nano-Electronic Systems

The increasing number of fabrication defects, spatial and temporal variability of parameters, as well as the growing impact of soft errors in nanoelectronic systems require a paradigm shift in design, verification and test...

Keywords: Nanoelektronik, Entwurf, Test, Zuverlässigkeit, Fehlertoleranz/Nano-electronics