X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults...
Keywords: X-ray line profile analysis, Nanomaterials, Crystallite size, Dislocations, Planar defects
11/2007 | Zeitschrift für Kristallographie, Oldenbourg WissenschaftsverlagThe aim of the present study was to determine the effect of a variety of abnormal fibres on the mechanical properties of paper made from Norway spruce,
Keywords: abnormal fibres, cell wall, compression, Dislocations, fertilisation, irrigation, kappa number, kraft cooking, tear index, tensile index, tensile strength
03/2008 | Holzforschung, Walter de GruyterAxial compressive stresses can cause distortion of the cellulose fibril alignment in the wood cell wall...
Keywords: cell wall, Dislocations, mechanical properties, microscopy
01/2008 | Holzforschung, Walter de Gruyter