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Crystallite size
Items for "Crystallite size"
Nanocrystalline materials studied by powder diffraction line profile analysis
X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain...
Keywords: X-ray powder diffraction, Line profile analysis, Nanocrystals, Crystallite size, Subgrains
03/2007 | Zeitschrift für Kristallographie, Oldenbourg WissenschaftsverlagCharacterization of defect structures in nanocrystalline materials by X-ray line profile analysis
X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults...
Keywords: X-ray line profile analysis, Nanomaterials, Crystallite size, Dislocations, Planar defects
11/2007 | Zeitschrift für Kristallographie, Oldenbourg Wissenschaftsverlag