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S. Patzelt, P. Lehmann, A. Ciossek, Gert Goch

In-process Characterization of Surface Microtopographies Using Speckle Correlation Methods

The task of in-process roughness characterization of engineered surfaces has not been solved adequately so far. At best, conventional measuring instruments enable an in-situ roughness characterization, i.e. if the surface investigated is at rest. Measuring devices based on scattered coherent light have in-process capabilities. This paper presents new approaches of parametric optical measurements for the characterization of the roughness of smooth surfaces (Ra ≤ 0,15 μm) and fatigue states of periodically stressed materials.

tm – Technisches Messen, Oldenbourg Wissenschaftsverlag

Print ISSN: 0171-8096
Volume: 67, 10/2000
Pages: 415

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