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Heiko Hengen, Michael Feid, Madhukar Pandit

Overview of Supervised learning Classification Methods, Part 1

This paper gives an overview of classification methods applicable to technical diagnosis and image processing problems. A choice from the number of available methods is dealt in this article. The focus is however on the practical application of the presented methods, on the drawbacks and advantages of their application. The classifiers are assessed using characteristic feature distributions. Then methods for the assessment of the quality of the employed features based on available quality measures are discussed.

at – Automatisierungstechnik, Oldenbourg Wissenschaftsverlag

Print ISSN: 0178-2312
Volume: 52, 03/2004
Pages: 0A1

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