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Andreas Meixner, Andreas Purde, Hans Schweizer, Philipp Kirilenko, Markus Riemenschneider, Thomas Zeh, Alexander W. Koch

Methods for Interferometric Contour Measurement of Non Stationary Technical Surfaces

Modern quality testing of engineered surfaces requires non-contact and non-destructive measurement methods. Triangulation as well as white-light interferometry fulfill most of these requirements regarding measurement precision. These methods, however, are mostly limited to stationary objects. An interesting alternative is two-wavelength speckle-interferometry which can be used in applications, where measurement duration plays a crucial role. A measuring system is introduced which is capable of recording all data necessary for interferometric surface contouring simultaneously. Thus the influence of movement can be suppressed significantly. A GPU based (GPU = Graphic Processing Unit) interferogram evaluation permits both high measuring speed and measuring rate.

tm – Technisches Messen, Oldenbourg Wissenschaftsverlag

Print ISSN: 0171-8096
Volume: 71, 04/2004
Pages: 211 - 217

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