A time domain measurement technique is introduced to determine the protection characteristics of an electrically conductive shield against transient electromagnetic fields. For the measurement, pulses of double exponential time wave form are used. With these pulses, the susceptibility of an operating electronic device with and without the shield is determined. The breakdown failure rates found in both cases are compared as a criterion of quality of a shield. The measurement technique is based on the determination of probability rates for breakdown or destruction of a system. Tests performed with microcontrollers and microprocessorboards reveal a good comparability of the results.
Print ISSN: 0171-8096
Volume: 72, 04/2005
Pages: 215 - 222