You are here: Home :: Area NEM :: Engineering :: Machine construction

Stefan Werling, Jürgen Beyerer

Inspection of Specular Surfaces with Inverse Patterns

Keywords: deflectometry, shape from specular reflection, inverse patterns, image processing, specular free forms

The application of inverse patterns to fast and robust mirror surface evaluation is shown. In a well controlled environment, one observes via the mirror surface a screen onto which a well-defined pattern is displayed. Evaluation of the deflected pattern is used to determine surface defects of the object under test. In some cases it is possible to calculate inverse patterns in advance, in which the surface topography is given implicitly. Using these inverse patterns results in bottom-of-the-range and fast surface examination, which is a benefit compared to the commonly used deflectometric methods.

tm – Technisches Messen, Oldenbourg Wissenschaftsverlag

Print ISSN: 0171-8096
Volume: 74, 04/2007
Pages: 217 - 223

Show full article (external site)

Show all available items of this journal

 

Area NEM