The inverse fringe- and pattern projection technique is demonstrated as well as applications for this technique. The technique enables to perform fast and robust 3D quality control as well as fast deformation measurements where only one camera image is needed for each state. Any pattern can be adapted to the object independently of the object curvature. Any (measured) properties can be directly mapped for the operator onto the object under investigation in their corresponding location (Augmented Reality).
Print ISSN: 0171-8096
Volume: 70, 02/2003
Pages: 099