Production test of complex embedded systems is difficult and expensive. Analog components are often the source. The performance test of these components requires very complex and expensive testers, and a test can last several minutes [1]. In this paper, power-supply current measurements, which are already used for digital testing, are used by the test design for analog components. The presented simulation-based test design method is based on deterministic and statistical methods and allows for inference from test measurements to specified performances. The test design method is evaluated by the simulation results of a CMOS OpAmp.
Print ISSN: 1611-2776
Volume: 41, 02/1999
Pages: 42