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Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich

DFG-Project – Test and Reliability of Nano-Electronic Systems

Keywords: Nanoelektronik, Entwurf, Test, Zuverlässigkeit, Fehlertoleranz/Nano-electronics

The increasing number of fabrication defects, spatial and temporal variability of parameters, as well as the growing impact of soft errors in nanoelectronic systems require a paradigm shift in design, verification and test. A robust design is mandatory to ensure dependable systems and acceptable yields. The quest for design robustness, however, invalidates many traditional approaches for testing and implies enormous challenges. Within the framework of the RealTest project unified design and test strategies are developed to support a robust design and a coordinated quality assurance after the production and during the lifetime of a system.

it – Information Technology (vormals it+ti), Oldenbourg Wissenschaftsverlag

Print ISSN: 1611-2776
Volume: 48, 05/2006
Pages: 304 - 311

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