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J. Reck, U. Beck, J.K. Dohrmann

Electrodeposition of CdSe Films: In-Situ Study by Spectroscopic Ellipsometry

CdSe films grown on Ti-coated polished steel by constant-current deposition from an aqueous solution containing selenosulfite and cadmium nitrilotriacetate have been studied by spectroscopic ellipsometry under in-situ conditions. Ellipsometric parameters, tanΨ and cosΔ, were measured both as a function of deposition time at λ = 825 nm and of wavelength (λ = 500-900 nm) for constant film thickness from 0.02 μm to 2.3 μm. The model used for data analysis, Ti-substrate | TiO₂ | CdSe-film | solution, with optically homogenous phases was valid for film thickness larger than 0.3 μm. Refractive indices and extinction coefficients of the 2.3-μm film were derived for λ = 500–900 nm. A direct band-gap of 1.72 eV was determined. The faradaic efficiency of electrodeposition was 0.93 for a current density of 50 μA cm^-2.

Zeitschrift für Physikalische Chemie, Oldenbourg Wissenschaftsverlag

Print ISSN: 0942-9352
Volume: 214, 01/2000
Pages: 083

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