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Gene E. Ice, Rozaliya I. Barabash, Wenjun Liu

Diffuse X-ray scattering from tiny sample volumes

The emergence of intense synchrotron X-ray sources, efficient focusing optics and high-performance X-ray sensitive area detectors allows for measurements of diffuse scattering from cubic micron-scale sample vol umes. Here we present an experiment that illustrates methods for studying the local structure and defect content of tiny sample volumes. In the experiment, an X-ray microbeam illuminating about ∼5 μm³ of a Ni-based superalloy single crystal, is used to collect Laue patterns and reciprocal space volume maps around fundamental and a superstructure reflections. This measurement illustrates how diffuse reciprocal-space distributions can be collected with good spatial and momentum-transfer resolution from a tiny real-space sample volume. This example demonstrates that emerging diffuse scattering techniques can provide fundamentally new information about crystallographic organization and defect content over many length scales.

Zeitschrift für Kristallographie, Oldenbourg Wissenschaftsverlag

Print ISSN: 0044-2968
Volume: 220, 12/2005
Pages: 1076 - 1081

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